Publications

DIRECT CURRENT DISCHARGE FORMATION AND EXPANSION AT ATMOSPHERIC PRESSURE

2008 - D. Dudek, J. Engelmann, Peter Awakowicz

Eleventh International Conference on Plasma Surface Engineering, PSE 2008

Large Scale Integration of Wind Energy in Weak Grids by Optimal Power Control

2008 - Bingchang Ni, Constantinos Sourkounis

International Workshop on Deregulated Electricity Market Issues in South-Eastern Europe 2008 (DEMSEE 2008) Nicosia, Zypern

OES Analysis of a Large Scale HIPIMS/UBM Sputtering Process to Produce C-DLC Coatings

2008 - Nikita Bibinov, S. Kunkel, Peter Awakowicz, W.-D. Münz

Eleventh International Conference on Plasma Surface Engineering, PSE 2008

Plasma and thin film growth control in dual frequency driven capacitive discharges

2008 - Egmont Semmler, D. O'Connell, T. Gans, A. Yüce, Peter Awakowicz, A. von Keudell

Eleventh International Conference on Plasma Surface Engineering, PSE 2008

Silicon oxide permeation barrier coating and plasma sterilization of PET bottles and foils

2008 - M. Deilmann, H. Halfmann, Simon Steves, Nikita Bibinov, Peter Awakowicz

Eleventh International Conference on Plasma Surface Engineering, PSE 2008

Storage System Management in Wind Parks with high Wind induced Power Fluctuations

2008 - Constantinos Sourkounis , Richter, F.

International Workshop on Deregulated Electricity Market Issues in South-Eastern Europe 2008 (DEMSEE 2008) Nicosia, Zypern

A hybrid, one-dimensional model of capacitively coupled radio-frequency discharges

2008 - Brian Heil, Julian Schulze, Dirk Luggenhölscher, Uwe Czarnetzki, Thomas Mussenbrock, Ralf Peter Brinkmann

J. Phys. D: Applied Physics, Volume 41, Number 22 [DOI]

Improvement of a multi-fluid plasma model for the near-cathode region in thermal plasmas

2008 - Frank Holger Scharf, Ralf Peter Brinkmann

Phys. D: Appl. Phys. 41 185206

Nonlinear dynamics of dual frequency capacitive discharges: a global model matched to an experiment

2008 - Dennis Ziegler, Thomas Mussenbrock, Ralf Peter Brinkmann

PSST Volume 17, Number 4 [DOI]
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