Publications

Emission dynamics of (GaIn)(NAs) vertical-cavity surface-emitting lasers

2000 - A. Wagner, C. Ellmers, F. Höhnsdorf, J. Koch, C. Agert, Martin R. Hofmann , W.W. Rühle, W. Stolz

CLEO/IQEQ, San Francisco, USA

Investigation of disordered semiconductor quantum-wells by coherent excitation spectroscopy

2000 - A. Euteneuer, E. Finger, W. Stolz, T. Meier, P. Thomas, S.W. Koch, Martin R. Hofmann , W.W. Rühle

phys. stat. sol. (a) 178, 183

Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

2000 - Martin R. Hofmann , D. Karaiskaj, C. Ellmers, T. Maxisch, F. Jahnke, H.-J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, S.W. Koch, W.W. Rühle

phys. stat. sol.(a) 178, 179

Coherent coupling of excitons in disordered quantum-well structures

2000 - E. Finger, A. Euteneuer, Martin R. Hofmann , W. Stolz, W.W. Rühle

Nonlinear optics and excitation kinetics in semiconductors, Marburg

Gain and emission dynamics of (GaIn)(NAs)/GaAs lasers

2000 - A. Wagner, C. Ellmers, F. Höhnsdorf, J. Koch, S. Leu, W. Stolz, Martin R. Hofmann , W.W. Rühle

Nonlinear optics and excitation kinetics in semiconductors, Marburg

Squaring Architecture for GF(2^m) and its Applications in Cryptographic Systems

2000 - G. Orlando, Chris­tof Paar

Electronic Letters, vol. 36, no. 13, pp. 1116-1117, June, 2000. [pdf] [gz]

Cryogenic Noise Parameter Measurements of Microwave Devices

2000 - Ilona Rolfes, Thomas Musch, Burkhard Schiek †

Proceedings of the Conference on Precision Electromagnetic Measurement, pp. 373-376, Sydney, Australia, May 14-19, 2000 [IEEE Library]

Gain and emission dynamics of (GaIn)(NAs)/GaAs semiconductor lasers

2000 - A. Wagner, C. Ellmers, J. Koch, F. Höhnsdorf, S. Leu, W. Stolz, Martin R. Hofmann , W.W. Rühle

International COST 267 workshop, Berlin (invited)

New portable time-resolved photometer for monitoring the calcium dynamics of osteoblasts under mechanical and zero-gravity stimulation

2000 - J. Struckmeier, J. Tenbosch, Erk Mennenga-Klopp , M. Born, Martin R. Hofmann , D.W. Jones

Proc. SPIE 3921, 114
Page: