Interaction of phase and amplitude shaping in an external cavity semiconductor laser

2016 - Rouven H. Pilny, Benjamin Döpke, Jan C. Balzer, Carsten Brenner, Andreas Klehr, Götz Erbert, Günther Tränkle, Martin R. Hofmann

Proc. SPIE 9767; DOI: 10.1117/12.2212906

Timing jitter performance of mode-locked external cavity multi-quantum-well semiconductor lasers

2016 - Benjamin Döpke, Rouven H. Pilny, Heiko Horstkemper, Carsten Brenner, Andreas Klehr, Götz Erbert, Günther Tränkle, Martin R. Hofmann

Proc. SPIE 9767; DOI: 10.1117/12.2213042

Improved SESAMs for femtosecond pulse generation approaching the kW average power regime

2016 - C. G. E. Alfieri, A. Diebold, F. Emaury, E. Gini, Clara J. Saraceno, U. Keller

Optics Express Vol. 24, Issue 24, pp. 27587-27599

Simulating Reconfigurable Multiprocessor Systems-on-Chip with MPSoCSim

2016 - Philipp Wehner, Jens Rettkowski, Tobias Kalb, Diana Göhringer

ACM Transactions on Embedded Computing Systems (TECS), pp. 1-24, 2016.

Smarte Sensoren in der Feldebene

2016 - Thomas Glock, Martin Hillenbrand, Michael Hübner

atp edition, vol. 57, no. 11, pp. 32-42, 2015

Common-path digital holography microscopy of buried semiconductor specimen

2016 - Markus Finkeldey, Lena Göring, Nils C. Gerhardt, Martin R. Hofmann

Imaging and Applied Optics 2016, OSA Technical Digest (online), paper JW4A.40 [Link]

Ultra low-power, -area and -frequency CMOS thyristor based oscillator for autonomous microsystems

2016 - Dominic Funke, Pierre Mayr, Thomas Maeke, John S. McCaskill, Abhishek Sharma, Lukas Straczek, Jürgen Oehm

Journal Analog Integrated Circuits and Signal Processing, 2016, DOI 10.1007/s10470-016-0799-9

Understanding of the importance of the spore coat structure and pigmentation in the Bacillus subtilis spore resistance to low-pressure plasma sterilization

2016 - Raguse, Marina, Marcel Fiebrandt, Benjamin Denis, Katharina Stapelmann, Eichenberger, Patrick, Driks, Adam, Eaton, Peter, Peter Awakowicz, Moeller, Ralf

JOURNAL OF PHYSICS D-APPLIED PHYSICS Volume: 49 Issue: 28 Article Number: 285401 DOI: 10.1088/0022-3727/49/28/285401 Published: JUL 20 2016 [URL]

600-A Test System for Aging Analysis of Automotive Li-Ion Cells With High Resolution and Wide Bandwidth

2016 - Patrick Weßkamp, Peter Haußmann, Joachim Melbert

IEEE Trans. Instrum. Meas. (IEEE Transactions on Instrumentation and Measurement) 65 (7), S. 1651-1660 (2016) DOI:10.1109/TIM.2016.2534379

Analytical investigation into the resonance frequencies of a curling probe

2016 - Ali Arshadi, Ralf Peter Brinkmann

Plasma Sources Sci. Technol. 25 (2016) 045014 (11pp) [jour­nal web site]