Disorder induced dephasing in semiconductors

2000 - S. Weiser, T. Meier, J. Möbius, A. Euteneuer, E.J. Mayer, W. Stolz, Martin R. Hofmann , W.W. Rühle, P. Thomas, S.W. Koch

Phys. Rev. B 61, 13088

Investigation of disordered semiconductor quantum-wells by coherent excitation spectroscopy

2000 - A. Euteneuer, E. Finger, W. Stolz, T. Meier, P. Thomas, S.W. Koch, Martin R. Hofmann , W.W. Rühle

phys. stat. sol. (a) 178, 183

Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

2000 - Martin R. Hofmann , D. Karaiskaj, C. Ellmers, T. Maxisch, F. Jahnke, H.-J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, S.W. Koch, W.W. Rühle

phys. stat. sol.(a) 178, 179

Squaring Architecture for GF(2^m) and its Applications in Cryptographic Systems

2000 - G. Orlando, Chris­tof Paar

Electronic Letters, vol. 36, no. 13, pp. 1116-1117, June, 2000. [pdf] [gz]

New portable time-resolved photometer for monitoring the calcium dynamics of osteoblasts under mechanical and zero-gravity stimulation

2000 - J. Struckmeier, J. Tenbosch, Erk Mennenga-Klopp , M. Born, Martin R. Hofmann , D.W. Jones

Proc. SPIE 3921, 114

(GaIn)(NAs)/GaAs vertical-cavity surface-emitting laser with ultrabroad temperature operation range

2000 - A. Wagner, C. Ellmers, F. Höhnsdorf, J. Koch, C. Agert, S. Leu, Martin R. Hofmann , W. Stolz, W.W. Rühle

Appl. Phys. Lett. 76, 271

Axial strain imaging using a local estimation of the scaling factor from rf ultrasound signals

2000 - Elisabeth Brusseau, Christian Perrey, Philippe Delachartre, Michael Vogt, Didier Vray, Helmut Ermert

Ultrasonic Imaging, Vol. 22, No. 2, April 2000, pp. 95-107

Spectral filtering of femtosecond laser pulses by interference filters

2000 - R. Szipöcs, A. Köházi-Kis, P. Apai, E. Finger, A. Euteneuer, Martin R. Hofmann

Appl. Phys. B 70, 63

Multi-color, mode-locked Ti:sapphire laser with zero pulse jitter

2000 - R. Szipöcs, A. Euteneuer, E. Finger, Martin R. Hofmann

J. of Laser Physics 10, 1 (2000)