Normal-mode linewidths in a semiconductor microcavity with various cavity qualities
Martin R. Hofmann , D. Karaiskaj, C. Ellmers, T. Maxisch, F. Jahnke, H.-J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, S.W. Koch, W.W. Rühle
phys. stat. sol.(a) 178, 179