Normal-mode linewidths in a semiconductor microcavity with various cavity qualities

Martin R. Hofmann , D. Karaiskaj, C. Ellmers, T. Maxisch, F. Jahnke, H.-J. Kolbe, G. Weiser, R. Rettig, S. Leu, W. Stolz, S.W. Koch, W.W. Rühle

phys. stat. sol.(a) 178, 179

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